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parent strain 13032 jn  (ATCC)
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ATCC parent strain 13032 jn
Parent Strain 13032 Jn, supplied by ATCC, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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parental strain e coli k 12 mg1655  (ATCC)
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Parental Strain E Coli K 12 Mg1655, supplied by ATCC, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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parental strain  (ATCC)
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ATCC parental strain
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Parent Strain Trichoderma Reesei Tu 6, supplied by ATCC, used in various techniques. Bioz Stars score: 93/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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parental strains e coli atcc 25922  (ATCC)
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ATCC parental strains e coli atcc 25922
NTX-resistant mutant selection and stability. ( a ) Spontaneous mutation frequency of NTX resistance in wild-type S. enterica and <t>E.</t> <t>coli</t> strains was measured at 2×, 4×, and 8× MIC (8, 16, and 32 mg/L) after 48 h incubation at 37 °C. The resistance of colonies was supported by their ability to grow on NTX-containing media at the indicated concentrations. The frequency of resistance was determined by dividing the number of resistant mutants by the total number of cells determined by using dilutions of the overnight culture on agar media. Data are presented as mean ± Standard Error of the Mean (SEM) from two technical replicates ( n = 2). No mutations were observed at the concentration of 4× or 8× MIC (16 and 32 µg/mL, respectively). ( b ) MIC fold changes in selected mutant relative to their parental strains from ( a ). Parent–mutant pairs are indicated by vertical dotted lines. ( c ) Serial passage induction of the resistance to NTX against reference (hollow circle) and wild-type (solid star) E. coli and S. enterica . The y axis is the MIC-fold change in the tested isolates. Data are presented as mean ± SEM from two biological replicates ( n = 2). ( d ) Stability of NTX resistance mutations in two mutants from E. coli <t>ATCC</t> <t>25922</t> (Mut ATCC-D13 and Mut ATCC-D14) and two mutants from E. coli DSM 103263 (Mut DSM-D8 and Mut DSM-D14) in the absence of NTX. Mutant stability was quantified as the percentage of mutants in the original bacterial population, calculated by dividing the viable mutant cell count resistant to NTX by the total population and multiplying by a factor of 100. Three biological and two technical replicates were performed for each strain. Data are presented as mean ± SEM ( n = 3 biological replicates, each with two technical replicates).
Parental Strains E Coli Atcc 25922, supplied by ATCC, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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wildtype parent strain  (ATCC)
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ATCC wildtype parent strain
NTX-resistant mutant selection and stability. ( a ) Spontaneous mutation frequency of NTX resistance in wild-type S. enterica and <t>E.</t> <t>coli</t> strains was measured at 2×, 4×, and 8× MIC (8, 16, and 32 mg/L) after 48 h incubation at 37 °C. The resistance of colonies was supported by their ability to grow on NTX-containing media at the indicated concentrations. The frequency of resistance was determined by dividing the number of resistant mutants by the total number of cells determined by using dilutions of the overnight culture on agar media. Data are presented as mean ± Standard Error of the Mean (SEM) from two technical replicates ( n = 2). No mutations were observed at the concentration of 4× or 8× MIC (16 and 32 µg/mL, respectively). ( b ) MIC fold changes in selected mutant relative to their parental strains from ( a ). Parent–mutant pairs are indicated by vertical dotted lines. ( c ) Serial passage induction of the resistance to NTX against reference (hollow circle) and wild-type (solid star) E. coli and S. enterica . The y axis is the MIC-fold change in the tested isolates. Data are presented as mean ± SEM from two biological replicates ( n = 2). ( d ) Stability of NTX resistance mutations in two mutants from E. coli <t>ATCC</t> <t>25922</t> (Mut ATCC-D13 and Mut ATCC-D14) and two mutants from E. coli DSM 103263 (Mut DSM-D8 and Mut DSM-D14) in the absence of NTX. Mutant stability was quantified as the percentage of mutants in the original bacterial population, calculated by dividing the viable mutant cell count resistant to NTX by the total population and multiplying by a factor of 100. Three biological and two technical replicates were performed for each strain. Data are presented as mean ± SEM ( n = 3 biological replicates, each with two technical replicates).
Wildtype Parent Strain, supplied by ATCC, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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atcc 19606 parental strain  (ATCC)
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ATCC atcc 19606 parental strain
NTX-resistant mutant selection and stability. ( a ) Spontaneous mutation frequency of NTX resistance in wild-type S. enterica and <t>E.</t> <t>coli</t> strains was measured at 2×, 4×, and 8× MIC (8, 16, and 32 mg/L) after 48 h incubation at 37 °C. The resistance of colonies was supported by their ability to grow on NTX-containing media at the indicated concentrations. The frequency of resistance was determined by dividing the number of resistant mutants by the total number of cells determined by using dilutions of the overnight culture on agar media. Data are presented as mean ± Standard Error of the Mean (SEM) from two technical replicates ( n = 2). No mutations were observed at the concentration of 4× or 8× MIC (16 and 32 µg/mL, respectively). ( b ) MIC fold changes in selected mutant relative to their parental strains from ( a ). Parent–mutant pairs are indicated by vertical dotted lines. ( c ) Serial passage induction of the resistance to NTX against reference (hollow circle) and wild-type (solid star) E. coli and S. enterica . The y axis is the MIC-fold change in the tested isolates. Data are presented as mean ± SEM from two biological replicates ( n = 2). ( d ) Stability of NTX resistance mutations in two mutants from E. coli <t>ATCC</t> <t>25922</t> (Mut ATCC-D13 and Mut ATCC-D14) and two mutants from E. coli DSM 103263 (Mut DSM-D8 and Mut DSM-D14) in the absence of NTX. Mutant stability was quantified as the percentage of mutants in the original bacterial population, calculated by dividing the viable mutant cell count resistant to NTX by the total population and multiplying by a factor of 100. Three biological and two technical replicates were performed for each strain. Data are presented as mean ± SEM ( n = 3 biological replicates, each with two technical replicates).
Atcc 19606 Parental Strain, supplied by ATCC, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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a niger parent strain atcc 11414  (ATCC)
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ATCC a niger parent strain atcc 11414
NTX-resistant mutant selection and stability. ( a ) Spontaneous mutation frequency of NTX resistance in wild-type S. enterica and <t>E.</t> <t>coli</t> strains was measured at 2×, 4×, and 8× MIC (8, 16, and 32 mg/L) after 48 h incubation at 37 °C. The resistance of colonies was supported by their ability to grow on NTX-containing media at the indicated concentrations. The frequency of resistance was determined by dividing the number of resistant mutants by the total number of cells determined by using dilutions of the overnight culture on agar media. Data are presented as mean ± Standard Error of the Mean (SEM) from two technical replicates ( n = 2). No mutations were observed at the concentration of 4× or 8× MIC (16 and 32 µg/mL, respectively). ( b ) MIC fold changes in selected mutant relative to their parental strains from ( a ). Parent–mutant pairs are indicated by vertical dotted lines. ( c ) Serial passage induction of the resistance to NTX against reference (hollow circle) and wild-type (solid star) E. coli and S. enterica . The y axis is the MIC-fold change in the tested isolates. Data are presented as mean ± SEM from two biological replicates ( n = 2). ( d ) Stability of NTX resistance mutations in two mutants from E. coli <t>ATCC</t> <t>25922</t> (Mut ATCC-D13 and Mut ATCC-D14) and two mutants from E. coli DSM 103263 (Mut DSM-D8 and Mut DSM-D14) in the absence of NTX. Mutant stability was quantified as the percentage of mutants in the original bacterial population, calculated by dividing the viable mutant cell count resistant to NTX by the total population and multiplying by a factor of 100. Three biological and two technical replicates were performed for each strain. Data are presented as mean ± SEM ( n = 3 biological replicates, each with two technical replicates).
A Niger Parent Strain Atcc 11414, supplied by ATCC, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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m tuberculosis h37rv atcc 27294 parental strain  (ATCC)
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ATCC m tuberculosis h37rv atcc 27294 parental strain
NTX-resistant mutant selection and stability. ( a ) Spontaneous mutation frequency of NTX resistance in wild-type S. enterica and <t>E.</t> <t>coli</t> strains was measured at 2×, 4×, and 8× MIC (8, 16, and 32 mg/L) after 48 h incubation at 37 °C. The resistance of colonies was supported by their ability to grow on NTX-containing media at the indicated concentrations. The frequency of resistance was determined by dividing the number of resistant mutants by the total number of cells determined by using dilutions of the overnight culture on agar media. Data are presented as mean ± Standard Error of the Mean (SEM) from two technical replicates ( n = 2). No mutations were observed at the concentration of 4× or 8× MIC (16 and 32 µg/mL, respectively). ( b ) MIC fold changes in selected mutant relative to their parental strains from ( a ). Parent–mutant pairs are indicated by vertical dotted lines. ( c ) Serial passage induction of the resistance to NTX against reference (hollow circle) and wild-type (solid star) E. coli and S. enterica . The y axis is the MIC-fold change in the tested isolates. Data are presented as mean ± SEM from two biological replicates ( n = 2). ( d ) Stability of NTX resistance mutations in two mutants from E. coli <t>ATCC</t> <t>25922</t> (Mut ATCC-D13 and Mut ATCC-D14) and two mutants from E. coli DSM 103263 (Mut DSM-D8 and Mut DSM-D14) in the absence of NTX. Mutant stability was quantified as the percentage of mutants in the original bacterial population, calculated by dividing the viable mutant cell count resistant to NTX by the total population and multiplying by a factor of 100. Three biological and two technical replicates were performed for each strain. Data are presented as mean ± SEM ( n = 3 biological replicates, each with two technical replicates).
M Tuberculosis H37rv Atcc 27294 Parental Strain, supplied by ATCC, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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NTX-resistant mutant selection and stability. ( a ) Spontaneous mutation frequency of NTX resistance in wild-type S. enterica and E. coli strains was measured at 2×, 4×, and 8× MIC (8, 16, and 32 mg/L) after 48 h incubation at 37 °C. The resistance of colonies was supported by their ability to grow on NTX-containing media at the indicated concentrations. The frequency of resistance was determined by dividing the number of resistant mutants by the total number of cells determined by using dilutions of the overnight culture on agar media. Data are presented as mean ± Standard Error of the Mean (SEM) from two technical replicates ( n = 2). No mutations were observed at the concentration of 4× or 8× MIC (16 and 32 µg/mL, respectively). ( b ) MIC fold changes in selected mutant relative to their parental strains from ( a ). Parent–mutant pairs are indicated by vertical dotted lines. ( c ) Serial passage induction of the resistance to NTX against reference (hollow circle) and wild-type (solid star) E. coli and S. enterica . The y axis is the MIC-fold change in the tested isolates. Data are presented as mean ± SEM from two biological replicates ( n = 2). ( d ) Stability of NTX resistance mutations in two mutants from E. coli ATCC 25922 (Mut ATCC-D13 and Mut ATCC-D14) and two mutants from E. coli DSM 103263 (Mut DSM-D8 and Mut DSM-D14) in the absence of NTX. Mutant stability was quantified as the percentage of mutants in the original bacterial population, calculated by dividing the viable mutant cell count resistant to NTX by the total population and multiplying by a factor of 100. Three biological and two technical replicates were performed for each strain. Data are presented as mean ± SEM ( n = 3 biological replicates, each with two technical replicates).

Journal: Antibiotics

Article Title: In Vitro and In Vivo Evaluation of Nitroxoline as an Effective Antimicrobial Alternative to Poultry Production

doi: 10.3390/antibiotics15010062

Figure Lengend Snippet: NTX-resistant mutant selection and stability. ( a ) Spontaneous mutation frequency of NTX resistance in wild-type S. enterica and E. coli strains was measured at 2×, 4×, and 8× MIC (8, 16, and 32 mg/L) after 48 h incubation at 37 °C. The resistance of colonies was supported by their ability to grow on NTX-containing media at the indicated concentrations. The frequency of resistance was determined by dividing the number of resistant mutants by the total number of cells determined by using dilutions of the overnight culture on agar media. Data are presented as mean ± Standard Error of the Mean (SEM) from two technical replicates ( n = 2). No mutations were observed at the concentration of 4× or 8× MIC (16 and 32 µg/mL, respectively). ( b ) MIC fold changes in selected mutant relative to their parental strains from ( a ). Parent–mutant pairs are indicated by vertical dotted lines. ( c ) Serial passage induction of the resistance to NTX against reference (hollow circle) and wild-type (solid star) E. coli and S. enterica . The y axis is the MIC-fold change in the tested isolates. Data are presented as mean ± SEM from two biological replicates ( n = 2). ( d ) Stability of NTX resistance mutations in two mutants from E. coli ATCC 25922 (Mut ATCC-D13 and Mut ATCC-D14) and two mutants from E. coli DSM 103263 (Mut DSM-D8 and Mut DSM-D14) in the absence of NTX. Mutant stability was quantified as the percentage of mutants in the original bacterial population, calculated by dividing the viable mutant cell count resistant to NTX by the total population and multiplying by a factor of 100. Three biological and two technical replicates were performed for each strain. Data are presented as mean ± SEM ( n = 3 biological replicates, each with two technical replicates).

Article Snippet: Parental strains E. coli ATCC 25922 and E. coli DSM 103263 were patched on drug-free medium only as controls.

Techniques: Mutagenesis, Selection, Incubation, Concentration Assay, Cell Characterization